An Automatic Configuration Method for Testing Integrated Circuits Independent of Chip Package Configuration

Inventor(s): Cong Xu, Yunghsiao (Steven) Chung, Feng Yu, Liwei Xu, Stephen Saddow Technology Classifications > Electronics > Electronics Sensors, Technology Classifications > Engineering > Electrical Engineering, Technology Classifications > Engineering > Manufacturing

Electronic Component Authenticity Via Electrical Signal Analysis Using Artificial Intelligence with Deep Learning

Inventor(s): Yunghsiao (Steven) Chung, Feng Yu, Stephen Saddow, Junjie Xiong Technology Classifications > Engineering > Electrical Engineering, Technology Classifications > Engineering > Manufacturing, Technology Classifications > Electronics > Electronics Sensors