Competitive Advantages
- Captures phase information of the optical field
- Speed of capturing the images is high
- Used to measure surface roughness
- Line scanning is simpler and faster compared to point scanning
Summary
Inventors at USF have developed systems and methods that can be used to capture high-quality intensity images of optical sections and obtain a quantitative phase map for each optical section at a high speed. This is achieved by combining the merits of line-scanning confocal systems with digital holography imaging. This invention has applications in industrial inspection and biomedical imaging.
Three-Dimensional Pseudo-Color Rendering of Phase Map
Desired Partnerships
- License
- Sponsored Research
- Co-Development